Patent · US Expired

Electronic device for testing bonding wire integrity

US5909034A · kind A · utility

11Cited by
5References
15Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 17, 1996
Grant dateJun 1, 1999
Priority date
Expiry dateMay 17, 2016

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/19043
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A device presenting pairs of split contact pad portions, each pair of pads having multiple bonding wire, and metal connecting strips associated therewith. The end portion of the metal connecting strips being split into parallel strip segments, each connected to a respective contact pad, so as to form a plurality of parallel current paths between a node and an external contact pin connected to the node. When current is supplied along the connecting strip a voltage drop along each segment connected to a sound bonding wire is produced, but not along the segments connected to broken or non-bonded wires. By determining the existence of a voltage difference between the contact pad portions, it is possible to detect the interruption of one or more of the bonding wires.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.