Semiconductor integrated circuit device having burn-in test capability and method for using the same
US5909142A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Aug 5, 1997 |
| Grant date | Jun 1, 1999 |
| Priority date | — |
| Expiry date | Aug 5, 2017 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG05F1/465
- WIPO fieldControl
- WIPO sectorInstruments
Abstract
A semiconductor integrated circuit device includes a flat-range voltage supply unit which steps down an external power supply voltage and generates a resultant, flat-range voltage, and a burn-in voltage supply unit which generates a burn-in voltage depending on the external power supply voltage. A switching unit selects either the flat-range voltage or the burn-in voltage, a selected voltage being supplied to an internal circuit. A switching instruction unit includes switches and generates a switching instruction signal by an ON/OFF control of the switches. A switching control unit controls the switching unit in accordance with the switching instruction signal.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.