Patent · US Expired

Apparatus and method for binocular measurement system

US5911161A · kind A · utility

8Cited by
33References
2Claims
0Family size

Assignee

Inventor

Key dates

Filing dateSep 22, 1997
Grant dateJun 8, 1999
Priority date
Expiry dateSep 22, 2017

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01B11/0691
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An apparatus and method are disclosed wherein a linear array of electromagnetic radiation emitting devices are arranged in association with a moving workpiece. Electromagnetic radiation emitted by the array is received by two or more receivers. Several non-contact measurements may be obtained on a workpiece using the present apparatus and methods.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.