Patent · US Expired

Temperature control for high power burn-in for integrated circuits

US5911897A · kind A · utility

63Cited by
11References
7Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJan 13, 1997
Grant dateJun 15, 1999
Priority date
Expiry dateJan 13, 2017

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L2924/3011
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A temperature control system for high power burn-in of integrated circuit chips which includes an individual heat sink at each of the integrated circuit chips to dissipate heat generated by the integrated circuit. A heater for each chip is provided and is temperature controlled so that heat may be added by the heater as a function of the heat generated by the integrated circuit chip. A temperature sensor is provided in close thermal contact with the integrated circuit chip to sense the temperature of the integrated circuit chip. A closed loop temperature controller is used to vary the amount of current provided to the heater to maintain a desired range of temperature. Thermal contact between the temperature sensor and the integrated circuit chips is insured by utilizing a spring to urge the sensor toward the integrated circuit chip.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.