Pattern detection method
US5912985A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Nov 7, 1995 |
| Grant date | Jun 15, 1999 |
| Priority date | — |
| Expiry date | Nov 7, 2015 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V10/757
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
When an image of an object is recognized, a template having a size smaller than the object is used. First, operation reference points C.sub.s (X.sub.m, Y.sub.n) are set at steps smaller than lengths along the X and Y directions of an image of an object to be recognized, and a template T(x.sub.i, y.sub.i) is set at the operation reference points C.sub.s (X.sub.m, Y.sub.n). Then, an equation, ##EQU1## is operated based on the template T(x.sub.i, y.sub.i) and the image data P(X, Y). Next, candidate points are determined as points having M(X.sub.m, Y.sub.n) larger than a reference value. Then, a position of the image of the object is determined according to the candidate points. Even if an image to be recognized is inclined, the position and the slope of the image can be detected at a fast speed even for image data with noise.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.