Solid state area x-ray detector with adjustable bias
US5920070A · kind A · utility
41Cited by
5References
9Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Nov 27, 1996 |
| Grant date | Jul 6, 1999 |
| Priority date | — |
| Expiry date | Nov 27, 2016 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04N5/325
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
A large area solid state x-ray detector employs a number of photodiodes that are charged electrically then discharged by exposure to x-ray. Ghost images resulting from release of charge trapped in photodiodes during prior exposures are eliminated by adjusting the biasing during a reset portion of the imaging cycle. Biasing may be increased to decrease the recharge time or reversed in polarity to evenly discharge the diodes or decreased to preserve the offset so that it may be removed from subsequent images by image processing.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.