Patent · US Expired

Automated system for determining the dynamic thresholds of digital logic devices

US5926486A · kind A · utility

3Cited by
2References
12Claims
0Family size

Assignee

Inventor

Key dates

Filing dateNov 25, 1997
Grant dateJul 20, 1999
Priority date
Expiry dateNov 25, 2017

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/31935
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An automated dynamic threshold testing system using an oscilloscope and personal computer with an automated testing algorithm for dynamic threshold condition determination within a digital logic device. The system provides a cost-effective alternative to conventional human detection of the threshold condition. The automated testing utilizes digitization of waveform data from the oscilloscope and provides fast storage, retrieval, and analysis of complex and numerous threshold conditions. Reproduction of the testings is easily performed with advantageous applications in debugging and diagnostic procedures.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.