Method for automatic diagnosis of malfunctions

US5926621A · kind A · utility

Assignee

• Siemens Aktiengesellschaft · DE

Inventors

• Peter Schwarz · Speyer, DE
• Ulrich Bungert · Stein, DE
• Rolf Kramer · Siegen, DE

Key dates

• Filing date: Sep 30, 1996
• Grant date: Jul 20, 1999
• Expiry date: Sep 30, 2016

Classification

• Technology area (CPC G): Physics
• CPC primary: G05B2219/14058
• WIPO field: Control
• WIPO sector: Instruments

Abstract

In the case of processor or installations, or both, which are monitored by sequence control from a PLC program which is produced as a contact plan (KOP), as a function plan (FUP) or as an instruction list (AWL), the AWL code of the PLC program is analyzed by machine and is prepared in the form of a knowledge base, according to the invention, in order to prepare for diagnosis. Step chain analysis and/or a transition analysis are/is carried out in order to prepare the knowledge base.