Side scatter tomography system
US5930326A · kind A · utility
202Cited by
2References
33Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jul 8, 1997 |
| Grant date | Jul 27, 1999 |
| Priority date | — |
| Expiry date | Jul 8, 2017 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01V5/226
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An x-ray tomography system measures x-rays side-scattered by material concealed within an enveloping surface. One or more x-ray beams are incident on the enveloping surface and scattered onto collimated detectors disposed in arrays parallel to the incident x-ray beams. By varying the relative orientation of the enveloping surface with respect to the x-ray beams and measuring the x-rays side-scattered by the material concealed within the enveloping surface, the shape, density, position and composition of the contents of the enveloping surface may be mapped.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.