Patent · US Expired

Method for fabricating an integrated field emission device

US5930589A · kind A · utility

2Cited by
4References
21Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 28, 1997
Grant dateJul 27, 1999
Priority date
Expiry dateFeb 28, 2017

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J9/025
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

A method for fabricating an integrated field emission device (90) includes the steps of: (1) providing a substrate (52), (2) forming a conductive layer (54) on the substrate (52), (3) depositing a dielectric layer (56) on the conductive layer (54), (4) forming an emission well (62) in the dielectric layer (56), (5) forming an emissive film (72) over the dielectric layer (56) so that the emissive film (72) extends partially into the emission well (62) to define an emissive edge (94) within the emission well (62), and (6) selectively etching the dielectric layer (56) proximate to the emissive edge (94) so that electrons emitted by the emissive edge (94) are received by the conductive layer (54).

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.