Method and apparatus for measuring the thickness of non-circular elongated workpieces
US5930734A · kind A · utility
11Cited by
7References
11Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Nov 4, 1997 |
| Grant date | Jul 27, 1999 |
| Priority date | — |
| Expiry date | Nov 4, 2017 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B11/10
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention relates to a method for measuring the thickness of non-circular elongated workpieces in which the thickness of the workpiece is measured along three measuring axis, the measurements are fed into a computer to determine minimum and maximum values and associated angular positions of the measuring axis, the measuring systems are rotated to a zero measuring position and the measured thicknesses are correlated by an algorithm, and the computer computes the degree for which angular position of the mimimum and maximum changes when the workpiece is advanced.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.