Measurement and control system for controlling system functions as a function of rotational parameters of a rotating device
US5932874A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Oct 10, 1997 |
| Grant date | Aug 3, 1999 |
| Priority date | — |
| Expiry date | Oct 10, 2017 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01D5/34
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A measurement and control system for controlling system functions as a function of rotational parameters of a rotating device includes a plurality of interval markers distributed around the periphery of the rotating device and fixed relative to the device support. The measurement and control system also includes a plurality of sensors attached to the periphery of the rotating device, fixed relative to the rotating device so as to be in close proximity to the interval markers. Measurements from sensors attached to different locations on the rotating device are combined so as to mitigate variations in angular speed of the device. Measured rotational parameters are used to predict, via linear interpolation, angular positions of the device between those positions measured by the sensors.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.