Method for space-charge control of daughter ions in ion traps
US5936241A · kind A · utility
11Cited by
3References
9Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Feb 27, 1998 |
| Grant date | Aug 10, 1999 |
| Priority date | — |
| Expiry date | Feb 27, 2018 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J49/4265
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
The invention consists of deriving the control of the space charge in the ion trap for the initial daughter ion spectrum from the filling rates of previous normal spectra, from the abundance ratio of the parent ions to be isolated to the total ions in the spectrum, and from the at least roughly known isolation and fragmentation yields. For further daughter ion spectra, the resulting measured overall filling rate with daughter ions may be used. The same applies in an analogue way to spectra of isolated ions or of ions from MS.sup.n processes.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.