Patent · US Expired

Method and system for obtaining x-ray single photon spectroscopic data using room-temperature solid state detectors by measuring the induced electron current

US5936249A · kind A · utility

23Cited by
2References
23Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 16, 1997
Grant dateAug 10, 1999
Priority date
Expiry dateOct 16, 2017

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01T1/247
  • WIPO fieldEnvironmental technology
  • WIPO sectorChemistry

Abstract

A method and a system for obtaining spectroscopic data of a single photon of a given energy that undergoes an interaction, beginning at a given point in time, with a room-temperature solid state detector of a given thickness and fitted with two electrodes, which detection is held at a given bias by a voltage applied to the electrodes. In the course of the interaction, pairs of electrons and holes are created within the solid state detector which induce charge on the electrodes; the method and system enable for determination of a current induced by the electrons, being a measurable and quite accurate parameter for deducing spectroscopic data. The electron induced current is defined as the charge induced on the electrodes due to the electrons only, divided by the time it takes the electrons to induce this charge. The mentioned time is considered equal to that of a particular portion of a signal of the complete induced charge, and both the time and the charge are determined by the method and the system.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.