Patent · US Expired

Repair circuit of a flash memory cell and repair method

US5936970A · kind A · utility

6Cited by
1References
8Claims
0Family size

Assignee

Inventor

Key dates

Filing dateSep 26, 1996
Grant dateAug 10, 1999
Priority date
Expiry dateSep 26, 2016

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C29/83
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

The present invention relates to a repair circuit of a flash memory cell and repair method and has excellent effects in that it can reduce the power consumption by detecting the power supply applied to the chip, latching the repaired address stored in the fuse block after the chip itself sequentially reads the fuse block, comparing the latched address with the input repair address to access the main cell and repair cell, consuming the power only while the chip reads the fuse block, and using the latched repair address at other operation, and it can reduce the area of the chip by constructing into a cell array the cells to which the repair address is to be stored and using the sense amplifier commonly.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.