Coded aperture X-ray imaging system
US5940468A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Nov 7, 1997 |
| Grant date | Aug 17, 1999 |
| Priority date | — |
| Expiry date | Nov 7, 2017 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01T1/295
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An X-ray imaging system which measures X-rays scattered by material concealed within an enveloping surface. A beam of X-ray radiation is incident on the enveloping surface and scattered onto one or more arrays of detectors. One or more masks of material opaque to X-ray transmission but for a series of apertures is interposed between the object and the detectors so as to cast shadows on different parts of the detector array. The image of the scattering material, as detected at the detector array, is modulated by the pattern of mask apertures. A controller reconstructs the image of the illuminated line. By scanning the illumination with respect to the object, an image of the entire object in scattered radiation is obtained, while use of multiple arrays or variation of geometrical settings allows reconstruction of the source of scattering in three dimensions.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.