Patent · US Expired

High-temperature superconducting random access memory

US5942765A · kind A · utility

15Cited by
5References
7Claims
0Family size

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Key dates

Filing dateNov 20, 1997
Grant dateAug 24, 1999
Priority date
Expiry dateNov 20, 2017

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C11/44
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

In the random access memory utilizing an oxide high-temperature superconductor, a first high-temperature superconductor layer 1, a non-superconductor layer 2, a second high-temperature superconductor layer 3 and a non-superconductor layer 4 are formed on an insulated substrate. The first high-temperature superconductor layer 1 is formed in a first loop, forming a memory storage superconductor quantum interference device by two Josephson junctions and a control current line I.sub.WX (6) and a bias current line I.sub.WY (8) in order to store the flux quantum. The second high-temperature superconductor layer 3 is formed in a second loop, forming a reading superconducting quantum interference device by two Josephson junctions and a control current line I.sub.RX (5) and a bias current line I.sub.RY (7). By use of the characteristic where the output is occurred according to the polarity of the flux quantum held by the first loop, the writing and reading of the memory is done by a binary logic of "0" and "1", and functions as a random access memory.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.