Patent · US Expired

Apparatus for EMC testing of electrical devices

US5942903A · kind A · utility

1Cited by

4References

17Claims

0Family size

Assignee

Rohde & Schwarz GmbH & Co. KG · DE

Inventors

Klaus Danzeisen · Gräfelfing, DE
Klaus-Dieter Goepel · Munich, DE
Werner Schmidt · Chemnitz, DE

Key dates

Filing date	Nov 22, 1996
Grant date	Aug 24, 1999
Priority date	—
Expiry date	Nov 22, 2016

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/001
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

In an apparatus for EMC testing of electrical devices, conductors are arranged at opposite sides of a chamber of conductive material at a spacing from and parallel to the chamber walls. These conductors form a symmetrical double line and are fed out of phase at one end by a radio frequency source. They are electrically connected to the chamber walls at the other end via terminating impedances.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.