Patent · US Expired

Non-contact voltage probe apparatus

US5949230A · kind A · utility

17Cited by

5References

6Claims

0Family size

Assignee

NIPPON TELEGRAPH AND TELEPHONE CORPORATION · JP

Inventors

Ryuichi Kobayashi · Yokohama, JP
Mitsuo Hattori · Tokyo, JP
Tsuyoshi Ideguchi · Tokyo, JP

Key dates

Filing date	Apr 4, 1996
Grant date	Sep 7, 1999
Priority date	—
Expiry date	Apr 4, 2016

Classification

Technology area (CPC G)Physics
CPC primaryG01R31/002
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

A non-contact voltage probe is used to measure the voltage of electromagnetic interference developed in a cable or the like electrically connected to pieces of electronic equipment. The non-contact voltage probe has double coaxial cylindrical-type inner and outer electrodes through which a cable or the like is passed. The inner electrode is electrically connected to a voltage detector, which measures the voltage induced by the capacitance between the inner electrode and the cable passing there through, and the outer electrode is grounded.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.