Method of determining measurement-point position data and device for measuring the magnification of an optical beam path
US5953114A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Dec 11, 1996 |
| Grant date | Sep 14, 1999 |
| Priority date | — |
| Expiry date | Dec 11, 2016 |
Classification
- Technology area (CPC A)Human Necessities
- CPC primaryA61B90/20
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention relates to a method of determining measurement-point position data and a device for measuring the magnification of an optical beam path. In the method described, a laser beam is inserted via an insertion element (32a) into the beam path of a microscope. At the end of this beam path, a beam splitter (4c) splits the laser beam off again and directs it on to a position sensor (45a). The point at which the measurement beam is incident depends on the magnification of the beam path optics (8, 13). The final value of the magnification can thus be simply determined. The value of the magnification is important for the user in order to enable the user to make a definite assessment of the area observed. Also described are various related developments and details of the invention.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.