Patent · US Expired

Method for manufacturing self-aligned titanium salicide using two two-step rapid thermal annealing steps

US5953633A · kind A · utility

19Cited by
6References
6Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 5, 1997
Grant dateSep 14, 1999
Priority date
Expiry dateAug 5, 2017

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D30/0212
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

A method of manufacturing self-aligned titanium salicide is provided which includes the steps of forming a LOCOS isolation region on a silicon substrate, forming a titanium layer on the surface of the silicon substrate, performing a first two-step rapid thermal anneal on the silicon substrate in an ambient filled with hydrogen and nitrogen gases to convert the titanium layer into a titanium salicide layer, selectively etching the silicon substrate to remove the titanium layer that has not reacted with the silicon substrate, and performing a second two-step rapid thermal anneal on the silicon substrate in an ambient filled with hydrogen and nitrogen gases. Each of the two-step rapid thermal anneals include a first pre-heat step and a second anneal step.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.