Optical inspection system
US5954206A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Jun 20, 1997 |
| Grant date | Sep 21, 1999 |
| Priority date | — |
| Expiry date | Jun 20, 2017 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/8806
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An optical inspection system inspect products passed through an inspection region. Light is directed onto the products form optical control units including light emitting diodes. Light emitted from the diodes is directed by cylindrical lenses onto the products at a specified target region, and a sensor detects light reflected from the products. Focussing is achieved by an outer row of the diodes being displaced outwardly relative to axes of respectively cylindrical lenses, so that light originating from the outer rows of diodes converges towards that passing along a central axis extending from a central row of the diodes through a central lens to the target region, light from all rows of the diodes being therefore focussed substantially at the target region.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.