Patent · US Expired

Method and apparatus for measurement of orientation in an anisotropic medium

US5955671A · kind A · utility

13Cited by
5References
42Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 28, 1997
Grant dateSep 21, 1999
Priority date
Expiry dateMar 28, 2017

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N2291/101
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method and apparatus are provided for simultaneously measuring the anisotropic orientation and the thickness of an article. The apparatus comprises a transducer assembly which propagates longitudinal and transverse waves through the article and which receives reflections of the waves. A processor is provided to measure respective transit times of the longitudinal and shear waves propagated through the article and to calculate respective predicted transit times of the longitudinal and shear waves based on an estimated thickness, an estimated anisotropic orientation, and an elasticity of the article. The processor adjusts the estimated thickness and the estimated anisotropic orientation to reduce the difference between the measured transit times and the respective predicted transit times of the longitudinal and shear waves.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.