Apparatus for measuring a reflection characteristic
US5956133A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Oct 27, 1998 |
| Grant date | Sep 21, 1999 |
| Priority date | — |
| Expiry date | Oct 27, 2018 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/474
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A reflection characteristic measuring apparatus is provided with a hollow integrating sphere. The integrating sphere is formed with four apertures: a sample aperture where a sample to be measured is placed; a first illumination aperture for allowing light to enter the sphere from a first illuminator; a second illumination aperture for allowing light to enter the sphere from a second illuminator; and a measurement aperture for allowing light to exit from the sphere. A photoreceptor receives light reflected from the sample that exits the measurement aperture. A reflection characteristic calculator is used to for calculating first and second reflection characteristics of the sample based on the light received by the photoreceptor. A corrector is used to correct the calculated first and second reflection characteristics.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.