Wrap-back test system and method
US5956370A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Jan 17, 1996 |
| Grant date | Sep 21, 1999 |
| Priority date | — |
| Expiry date | Jan 17, 2016 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH04Q2213/13322
- WIPO fieldDigital communication
- WIPO sectorElectrical engineering
Abstract
A wrap back test system and method for providing local fault detection within a section of an integrated I/O interface core device on an integrated circuit is disclosed. The system and method of this invention is suitable for use in any I/O interface having both a transmitter and a receiver section. The wrap back of input test data, prior to reformatting for transmission, to the receiver's data alignment stage permits fault detection within the core of an integrated I/O interface. By illustration, in a serializer/deserializer I/O, the wrap back of alignment pattern encoded parallel data, prior to serialization, to the receiver's data alignment stage permits identifying faults in just this portion of the I/O transceiver. The wrap back test system and method of this invention permits fault isolation of within the boundaries of the I/O core and independent of external logic or testers.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.