Semiconductor integrated circuit
US5958076A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Oct 28, 1997 |
| Grant date | Sep 28, 1999 |
| Priority date | — |
| Expiry date | Oct 28, 2017 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/318505
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A test unit for testing a random logical circuit and a functional macrocircuit according to a scan test mode signal and a macro test mode signal is provided. The test unit includes a first and a second bidirectional I/O module. Whereas the first bidirectional I/O module is a module for providing a macro test output signal outside or providing a scan test input signal to the random logical circuit, and in addition, for performing input/output processing of a first normal input signal and a first normal output signal with respect to the random logical circuit, the second bidirectional I/O module is a module for providing a macro test input signal to the functional macrocircuit or providing a scan test output signal outside, and in addition, for performing input/output processing of a second normal input signal and a second normal output signal with respect to the random logical circuit.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.