Patent · US Expired

Process for detecting evanescently excited luminescence

US5959292A · kind A · utility

35Cited by
10References
41Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 25, 1996
Grant dateSep 28, 1999
Priority date
Expiry dateNov 25, 2016

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N21/7743
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

The invention relates to a process for detecting luminescence with a planar dielectric optical sensor platform consisting of a transparent substrate (a) to which a thin transparent waveguiding layer (b) is applied, which sensor platform is provided with a grating for the input-coupling of the excitation light and the refractive index of said substrate (a) is lower than the refractive index of the waveguiding layer (b), by bringing a liquid sample into contact with the layer (b), and measuring the luminescence produced by substances having luminescence properties in the sample, or by substances having luminescence properties immobilized on the layer (b), optoelectronically. The invention also relates to the use of the process in quantitative affinity sensing and to the use thereof for the quantitative determination of luminescent constituents in optically turbid solutions.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.