Patent · US Expired

Column redundancy in semiconductor memories

US5959903A · kind A · utility

5Cited by
5References
20Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 31, 1997
Grant dateSep 28, 1999
Priority date
Expiry dateJul 31, 2017

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C11/4087
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

This invention describes a column redundancy method and apparatus in a DRAM that minimizes the timing difference between a normal and redundant column paths and which minimizes the number of fuses required in repairing faulty columns. The invention discloses a DRAM having memory elements arranged in rows and columns, the memory elements being accessible by decoding a memory address applied thereto, normal column drivers for energizing appropriate memory columns in response to the decoder memory addresses received at an input thereof; redundant column drivers; and switch means for steering the decoded memory address onto one of either normal or redundant column driver paths. The invention further illustrates a fusing system which minimizes the capacitance of redundant select lines, thereby removing unnecessary delay in the redundant column path.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.