Patent · US Expired

Method and apparatus for monitoring laser weld quality via plasma size measurements

US5961859A · kind A · utility

76Cited by
19References
30Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 23, 1997
Grant dateOct 5, 1999
Priority date
Expiry dateOct 23, 2017

Classification

  • Technology area (CPC B)Performing Operations; Transporting
  • CPC primaryB23K26/032
  • WIPO fieldMachine tools
  • WIPO sectorMechanical engineering

Abstract

A method and apparatus for monitoring the quality of a laser process such as a welding process comprises monitoring the light emitted from the weld plasma above the surface of the workpiece being irradiated by the laser beam. The size of the plasma is determined from the light emission and compared to a predetermined value of the size as determined under process and workpiece conditions that produce welds of acceptable quality. Variations of the monitored plasma size greater than a preselected value can represent unacceptable welds. Such variations can be caused by changes in the laser beam power, the workpiece speed, laser focusing problems, insufficient shield gas flow, workpiece deformation and weld contamination. The process monitors the light emission from a selected range of wavelengths that correspond to the major emission peaks of the light spectrum. The process enables in-process control.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.