Patent · US Expired

Thermoelectric microprobe

US5969238A · kind A · utility

31Cited by
6References
8Claims
0Family size

Assignee

Inventor

Key dates

Filing dateAug 29, 1997
Grant dateOct 19, 1999
Priority date
Expiry dateAug 29, 2017

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S977/875
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A microprobe for thermoelectric microscopic measurements comprises a probe body (11), which consists of a doped or intrinsically conductive semiconductor material and has at least one thermoelectric contact surface (19). The probe body (11) can carry a metal or semiconductor layer (17), which is separated from the probe body (11) by an insulating layer (16) except in the area of the thermoelectric contact surface (19). A process for the production of a microprobe for thermoelectric microscopic measurements is also given.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.