Patent · US Expired

Method for manufacturing polycrystal semiconductor film

US5970368A · kind A · utility

44Cited by
3References
18Claims
0Family size

Assignee

Inventors

Key dates

Filing dateSep 29, 1997
Grant dateOct 19, 1999
Priority date
Expiry dateSep 29, 2017

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01L21/02691
  • WIPO fieldSemiconductors
  • WIPO sectorElectrical engineering

Abstract

There is disclosed a method for manufacturing a polycrystal semiconductor film comprising the steps of applying a high energy beam to a surface of a semiconductor film comprising an amorphous or a polycrystal semiconductor provided on a surface of a substrate to melt only the semiconductor film, and solidifying the film via a solid and liquid coexisting state to form a semiconductor film comprising a polycrystal semiconductor having a large grain diameter, by heating a liquid part using a difference in an electric resistance in the liquid and solid coexisting state to heat only the liquid part, and by extending the solidification time until the completion of solidifying of the molten liquid crystal film. Furthermore, as the base film of the semiconductor film, a material having a melting point of 1600.degree. C. and a thermal conductivity of 0.01 cal/cm.s..degree. C. is used to suppress heat dissipation from the molten liquid of the semiconductor to the substrate so that time until the complete solidification can be prolonged. Furthermore, the beam is irradiated so as to form a standing wave at a predetermined position of the surface of the semiconductor film to generate the heat d…

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.