Module and apparatus for measuring temperature properties of an SRAM IC
US5971606A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Jul 22, 1997 |
| Grant date | Oct 26, 1999 |
| Priority date | — |
| Expiry date | Jul 22, 2017 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C2029/5002
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A module and apparatus for measuring temperature related properties of an SRAM IC includes circuitry for controlling writing of data to and reading of data from a pair of SRAM ICs, one of which is a control and the other of which is the SRAM IC being tested. The circuitry includes an address counter, a logic controller, two input buffers, two output data latches, and a data comparator, the effect of temperature on data input through the input buffers under control of the logic controller and address counter being analyzed by comparing data output through the data latches. In addition, the apparatus includes two separate seats for the respective SRAM ICs, one of which is subjected to a constantly controlled temperature and the other of which is subjected to a varying ambient temperature.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.