Socket for inspection of semiconductor device
US5975915A · kind A · utility
25Cited by
8References
6Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Dec 8, 1997 |
| Grant date | Nov 2, 1999 |
| Priority date | — |
| Expiry date | Dec 8, 2017 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01L2924/0002
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A socket for the inspection of semiconductor devices is disclosed which has laterally extended leads. The device is mounted in a mounting seat of the socket body and results in improvement of the inspection process because difficult steps such as soldering can be omitted. The socket is composed of a socket body which is mountable on a circuit board having a mounting seat therefor, a lead frame intervening between the socket body and the circuit board and an anisotropically electroconductive elastic connector sheet.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.