Patent · US Expired

Method for manufacturing a solid state image sensing device

US5976906A · kind A · utility

1Cited by
5References
12Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 18, 1996
Grant dateNov 2, 1999
Priority date
Expiry dateOct 18, 2016

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY02E10/548

Abstract

A solid state image sensing device having a semiconductor substrate, a first diffusion region of a positive or negative conductive type provided on the semiconductor substrate, a plurality of second diffusion regions each of which is an opposite conductive type relative to the first diffusion region and is provided in the first diffusion region, and a semiconductor thin layer provided on at least the second diffusion regions.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.