Patent · US Expired

Method for detecting open circuits with a measurement device

US5977774A · kind A · utility

5Cited by
6References
5Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 31, 1997
Grant dateNov 2, 1999
Priority date
Expiry dateOct 31, 2017

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/54
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method for determining whether a circuit under test is open is presented. A digital-to-analog converter is dithered to generate a known signal. This known signal is summed with an external attenuation signal which is brought into the system from a probe on the circuit under test. This summation is then measured by an analog-to-digital converter (ADC). If the known signal is not attenuated by the probe (i.e., the ADC measures essentially the known signal), we can conclude that the circuit is open.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.