Patent · US Expired

Semiconductor memory device having improved stacked capacitor cells

US5981989A · kind A · utility

2Cited by
0References
6Claims
0Family size

Assignee

Inventor

Key dates

Filing dateSep 26, 1994
Grant dateNov 9, 1999
Priority date
Expiry dateSep 26, 2014

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D1/68

Abstract

The invention provides a stacked capacitor cell structure for a semiconductor memory device. The cell includes a transistor formed in an active region in a surface of a semiconductor substrate; a first inter-layer insulator both overlying the transistor and having a contact hole over the transistor; a second inter-layer insulator both overlying the first inter-layer insulator and having a through hole with a larger diameter than the diameter of the contact hole; a stacked capacitor both formed within the through hole formed in the second inter-layer insulator and comprising a storage electrode electrically connected to the transistor through the contact hole, a capacitive insulation film and an opposite electrode; and a third inter-insulator overlying both the stacked capacitor and the second inter-layer insulator.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.