Method and apparatus measuring edges on a workpiece
US5982491A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Oct 20, 1997 |
| Grant date | Nov 9, 1999 |
| Priority date | — |
| Expiry date | Oct 20, 2017 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B11/005
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention is directed to a method and an apparatus for measuring the edges 13 of a workpiece 5 with an optical probe 4. The probe 4 measures the distance values (a) between the probe 4 and an adjustable scanning point 15. In the method, the scanning point 15 is moved along a loop path (36a, 36b, . . . , 36n) over the edge 13 of the workpiece 5 to be measured in order to obtain more exact values for measured points of the edge at a higher measuring speed. During the method, distance values (a) are measured by the probe 4 and a point P of the edge 13 is determined from the course of the measured values.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.