Patent · US Expired

Method and apparatus measuring edges on a workpiece

US5982491A · kind A · utility

23Cited by
1References
30Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 20, 1997
Grant dateNov 9, 1999
Priority date
Expiry dateOct 20, 2017

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01B11/005
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

The invention is directed to a method and an apparatus for measuring the edges 13 of a workpiece 5 with an optical probe 4. The probe 4 measures the distance values (a) between the probe 4 and an adjustable scanning point 15. In the method, the scanning point 15 is moved along a loop path (36a, 36b, . . . , 36n) over the edge 13 of the workpiece 5 to be measured in order to obtain more exact values for measured points of the edge at a higher measuring speed. During the method, distance values (a) are measured by the probe 4 and a point P of the edge 13 is determined from the course of the measured values.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.