Partitioning and reordering methods for static test sequence compaction of sequential circuits
US5983381A · kind A · utility
16Cited by
2References
17Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Dec 31, 1997 |
| Grant date | Nov 9, 1999 |
| Priority date | — |
| Expiry date | Dec 31, 2017 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/318392
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Methods of compacting sequential circuit test vector set by partitioning of faults into hard and easy faults, re-ordering vectors in a test set by moving sequences that detect hard faults to the beginning of the test set, and a combination of partitioning and re-ordering.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.