Semiconductor integrated circuit device capable of simultaneously performing self-test on memory circuits and logic circuits
US5987635A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Apr 22, 1997 |
| Grant date | Nov 16, 1999 |
| Priority date | — |
| Expiry date | Apr 22, 2017 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/318563
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An image processor, included in a logic circuit unit, for executing an image processing of data according to the MPEG standard and the like, a memory circuit unit, whose input port is included in the logic circuit unit, for storing image processed data, and a memory control unit, included in the logic circuit unit, for controlling the input/output operation of the memory circuit unit are formed on a semiconductor substrate. Between the memory circuit unit and the memory control unit, a selector is interposed for selecting, in accordance with a test mode signal, an externally input first chip select control signal when the test mode signal is activated, and selecting a second chip select control signal output by a memory control circuit and outputting a chip select signal to the memory circuit unit when the test mode signal is deactivated.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.