Patent · US Expired

Magnetoresistance effect film, a method of manufacturing the same, and magnetoresistance effect device

US5989690A · kind A · utility

11Cited by
1References
57Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 20, 1998
Grant dateNov 23, 1999
Priority date
Expiry dateMar 20, 2018

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10T428/31678
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

Magnetic thin films 2 and 3 are stacked on a substrate 4 with a nonmagnetic thin film 1 interposed therebetween. An antiferromagnetic thin film 5 is arranged adjacent to one magnetic thin film 3. The inequality Hc.sub.2 <Hr is satisfied between a bias magnetic field Hr of the antiferromagnetic thin film 5 and coercive force Hc.sub.2 of the other magnetic thin film 2. At least a part of the antiferromagnetic thin film 5 comprises NiMn of an fct structure. Alternatively, the antiferromagnetic thin film 5 comprises a two-layer structure composed of a CoO layer deposited on a NiO layer to a thickness between 10 and 40 angstroms.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.