Gamma camera quality test pattern
US5994693A · kind A · utility
0Cited by
13References
11Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Dec 26, 1997 |
| Grant date | Nov 30, 1999 |
| Priority date | — |
| Expiry date | Dec 26, 2017 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG21K1/06
- WIPO fieldEngines, pumps, turbines
- WIPO sectorMechanical engineering
Abstract
A gamma camera quality test pattern having a substrate which is substantially transparent to gamma radiation, the substrate having four quadrants, each quadrant containing a set of spaced L-shaped grooves filled with a material that is essentially opaque to gamma radiation.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.