Patent · US Expired

Testboard for IC tester

US5994894A · kind A · utility

12Cited by
2References
11Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJul 18, 1997
Grant dateNov 30, 1999
Priority date
Expiry dateJul 18, 2017

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/2889
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

This testboard for an IC tester comprises second connector 4, housing 7, cable 9, and socket board 12; and second connector 4 is mounted on base card 5 and engages first connectors 3 of a plurality of pincards 1. Housing 7 is mounted on base card 5 on the opposite side to second connector 4, holds third connector 8 which is fitted into second connector 4, while being arranged orthogonally to the above-mentioned plurality of pincards 1; and there is one housing 7 for each device 14 being tested. Cable 9 is connected to third connector 8 of housing 7 and to fourth connector 10 at the socket board 12 end. Fifth connector 11 which engages fourth connector 10 and IC socket 13 for the above-mentioned device 14 being tested are mounted on socket board 12.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.