Semiconductor memory device capable of multiple word-line selection and method of testing same
US5995429A · kind A · utility
13Cited by
6References
12Claims
0Family size
Assignee
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Key dates
| Filing date | Apr 9, 1998 |
| Grant date | Nov 30, 1999 |
| Priority date | — |
| Expiry date | Apr 9, 2018 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C29/34
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A semiconductor memory device capable of conducting test operations includes a plurality of word drivers which keep word lines in an active state when the word drivers are selected until the word drivers are reset. The semiconductor memory device further includes a control circuit which successively selects more than one of the plurality of word drivers so as to achieve simultaneous activation of word lines corresponding to selected ones of the plurality of word drivers during the test operations.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.