Patent · US Expired

End-sampling thief probe

US5996426A · kind A · utility

5Cited by

14References

6Claims

0Family size

Assignees

MERCK & CO., INC. · US
Rutgers, the State University of New Jersey · US

Inventors

Priscilla A. Robinson · Dorado, US
Dean Brone · Green Brook, US
Erinn K. Gleason · Fairfield, US
Fernando J. Muzzio · Sparta, US
Carolyn Wightman · Edison, US

Key dates

Filing date	Oct 6, 1997
Grant date	Dec 7, 1999
Priority date	—
Expiry date	Oct 6, 2017

Classification

Technology area (CPC G)Physics
CPC primaryG01N33/0091
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

This invention relates to an end-sampling thief probe and a method of using this probe. The thief probe of the invention is useful in extracting a sample with minimal disturbance and provides an improved method for end-sampling.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.