Patent · US Expired

Microelectromechanical (MEMS)-based magnetostrictive magnetometer

US5998995A · kind A · utility

19Cited by
5References
10Claims
0Family size

Assignee

Inventors

Key dates

Filing dateOct 3, 1997
Grant dateDec 7, 1999
Priority date
Expiry dateOct 3, 2017

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R33/02
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A microelectromechanical-based magnetostrictive magnetometer that uses, as an active element, a commercial (001) silicon microcantilever coated with an amorphous thin film of the giant magnetostrictive alloy Terfenol-D and a compact optical beam deflection transduction scheme. A set of Helmholtz coils is used to create an ac magnetic excitation field for driving the mechanical resonance of the coated microcantilever. When the coated microcantilever is placed in a dc magnetic field, the dc field will change the amplitude at the mechanical resonance of the coated microcantilever thereby causing a deflection that can be measured. The magnetometer has been demonstrated with a sensitivity near 1 .mu.T.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.