Microelectromechanical (MEMS)-based magnetostrictive magnetometer
US5998995A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Oct 3, 1997 |
| Grant date | Dec 7, 1999 |
| Priority date | — |
| Expiry date | Oct 3, 2017 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R33/02
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A microelectromechanical-based magnetostrictive magnetometer that uses, as an active element, a commercial (001) silicon microcantilever coated with an amorphous thin film of the giant magnetostrictive alloy Terfenol-D and a compact optical beam deflection transduction scheme. A set of Helmholtz coils is used to create an ac magnetic excitation field for driving the mechanical resonance of the coated microcantilever. When the coated microcantilever is placed in a dc magnetic field, the dc field will change the amplitude at the mechanical resonance of the coated microcantilever thereby causing a deflection that can be measured. The magnetometer has been demonstrated with a sensitivity near 1 .mu.T.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.