Patent · US Expired

Method and apparatus for the portable identification of material thickness and defects using spatially controlled heat application

US6000844A · kind A · utility

57Cited by
23References
17Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 4, 1997
Grant dateDec 14, 1999
Priority date
Expiry dateMar 4, 2017

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N25/72
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method and a portable apparatus for the nondestructive identification of defects in structures. The apparatus comprises a heat source (20) and a thermal imager (30) that move at a constant speed past a test surface (10) of a structure. The thermal imager (30) is off set at a predetermined distance from the heat source (10). The heat source (10) induces a constant surface temperature. The imager (20) follows the heat source (10) and produces a video image of the thermal characteristics of the test surface. Material defects produce deviations from the constant surface temperature that move at the inverse of the constant speed. Thermal noise produces deviations that move at random speed. Computer averaging of the digitized thermal image data with respect to the constant speed minimizes noise and improves the signal of valid defects. The motion of thermographic equipment coupled with the high signal to noise ratio render it suitable for portable, on site analysis.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.