Interconnect adapter to printed circuit assembly for testing in an operational environment
US6002264A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Aug 19, 1997 |
| Grant date | Dec 14, 1999 |
| Priority date | — |
| Expiry date | Aug 19, 2017 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/2887
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An interconnect adapter is used in operational environment testing of a printed circuit assembly unit. The interconnect adapter includes a main base assembly, a probe plate assembly and an engagement unit. The main base assembly includes an attachment structure for attaching the printed circuit assembly unit to the main base assembly. The printed circuit assembly unit, when attached to the main base assembly, is in position to be connected to a host device. The probe plate assembly is attached to the main base assembly and includes pins for electrical connection to test points for an integrated circuit on the printed circuit assembly unit. The engagement unit is for engaging the pins of the probe plate assembly in position to make electrical connection with the test points.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.