High resolution scanning raman microscope
US6002471A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Nov 4, 1997 |
| Grant date | Dec 14, 1999 |
| Priority date | — |
| Expiry date | Nov 4, 2017 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10S977/87
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of obtaining high-resolution spectroscopic information from a scanning microscope. An optical beam is directed at a sample and light emitted from the sample (e.g., from Raman scattering or fluorescence) is collected. Resolution is improved by supporting a tiny conductive element (e.g., a silver particle) from a probe located within the optical beam area. The conductive element enhances the light emitted from molecules in the vicinity of the probe. The invention provides the high spatial resolution of microscopes such as the AFM with the high chemical detection sensitivity of surface enhanced Raman spectroscopy. This combination allows the isolation and differentiation of single molecules on surfaces of nanostructures.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.