Semiconductor substrate and method of manufacturing same
US6008110A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Feb 11, 1997 |
| Grant date | Dec 28, 1999 |
| Priority date | — |
| Expiry date | Feb 11, 2017 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01L21/3226
- WIPO fieldSemiconductors
- WIPO sectorElectrical engineering
Abstract
A semiconductor substrate has a support substrate formed of monocrystal silicon, an oxide film formed on the support substrate and a thin film of monocrystal silicon formed on the oxide film. The support substrate is a high-concentration P-type substrate to which boron is so doped that a resistivity of the support base is 0.1 .OMEGA..cm or less. In manufacturing: boron is into the support base so that a resistivity of the support base is 0.1 .OMEGA..cm or less; a silicon substrate on which the thin film of monocrystal silicon is formed is heated at 1100.degree. C. or higher for 30 min or longer within a reducing atmosphere; the heat treated silicon substrate is attached to the high-concentration P-type support substrate via the oxide film formed on a surface of any one of the support substrate and the P-type silicon substrate and the attached substrates are heated at 950.degree. C. or higher for 10 min or longer to bond the attached substrates together; and the bonded silicon substrate is thinned.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.