Patent · US Expired

Method and apparatus for materials analysis by enhanced laser induced plasma spectroscopy

US6008897A · kind A · utility

30Cited by
0References
16Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJan 19, 1999
Grant dateDec 28, 1999
Priority date
Expiry dateJan 19, 2019

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N21/718
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A method and apparatus is disclosed for enhanced laser-induced plasma spectroscopic analysis of unknown heterogeneous materials. The apparatus has high power pulsed lasers with their beams focused on the material, typically two colinear lasers providing two pulses in the ultraviolet and in the near infrared spectral area. The first laser pulse vaporizes a small volume at the surface of the material and produces a plasma which is subsequently enhanced by the second laser pulse. The optical emission of the plasma is analyzed with a colinear optical spectrometer. The pulsed spectrum is detected by a gated photodiode array detector or by an array of photomultipliers each individually positioned to detect a line emission representative of a given element present in the material. The combination of the two laser pulses, appropriately synchronized, provides a plasma emission that is significantly stronger than a single laser pulse of the combined energy of the two pulses.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.